واژگان به همراه معادل های دقیق فارسی
لغات high 3
واژگان به همراه معادل های دقیق فارسی
100 صفحه
High Voltage Engineering
Fundamentals
Second edition
E. Kuffel
Dean Emeritus,
University of Manitoba,
Winnipeg, Canada
W.S. Zaengl
Professor Emeritus,
Electrical Engineering Dept.,
Swiss Federal Institute of Technology,
Zurich, Switzerland
J. Kuffel
Manager of High Voltage and Current Laboratories,
Ontario Hydro Technologies,
Toronto, Canada
Newnes
OXFORD AUCKLAND BOSTON JOHANNESBURG MELBOURNE NEW
Abstract
Background and purpose: The normalisation depth for determination of output factors in photon fields has frequently been the depth of
dose maximum. At high energies the contribution from contaminating electrons is significant at dose maximum and is critically dependent
on the beam geometry parameters, which is why a larger depth should be preferred.
Materials and methods: The effect of electron contamination was studied using a purging magnet to remove charged particles from the
treatment head and a helium bag to minimise production between the head and the phantom.
Results: A depth of 10 cm was found to be beyond the range of the contaminating electrons for photon energies up to 20 MV
(TPR$ = 0.772). However, at 50 MV (TPR:: = 0.810) contaminating electrons contribute 2-3% to the absorbed dose at 10 cm depth.
ConcZusions: 10 cm is recommended as both reference and normalisation depth for all megavoltage photon beam qualities, i.e. 6oCo and
X-rays from accelerators up to 50 MV. 0 1997 Elsevier Science Ireland Ltd.